发明名称 THREE-DIMENSIONAL COORDINATE MEASURING APPARATUS AND THREE-DIMENSIONAL COORDINATE MEASURING METHOD
摘要 The invention makes it possible to measure an object with a three dimensional shape that is made of various materials with a high degree of precision and at high-speed, without requiring a vast amount advance of preparation. A measuring unit detects internal scattering light measuring areas in a captured image, and obtains profiles of internal scattering light components in the areas. An estimating unit estimates the internal scattering light components in three-dimensional coordinate measuring areas based on the profiles of the internal scattering light components in the internal scattering light measuring areas. A reducing unit reduces the internal scattering light components in the three-dimensional coordinate measuring areas to generate a direct-reflected light component image. Then, a calculating unit calculates three-dimensional coordinates on measuring lines based on the direct-reflected light component image.
申请公布号 US2016102972(A1) 申请公布日期 2016.04.14
申请号 US201514876036 申请日期 2015.10.06
申请人 CANON KABUSHIKI KAISHA 发明人 Kobayashi Toshihiro
分类号 G01B11/25 主分类号 G01B11/25
代理机构 代理人
主权项 1. A three-dimensional coordinate measuring apparatus comprising: an input unit configured to input a captured image of an object in which internal scattering can occur onto which a pattern that has bright section areas and dark section areas is projected; an estimating unit configured to estimate an internal scattering light component in a first area that corresponds to a bright section area of the projected pattern in the captured image input by the input unit, based on a luminance value of a second area that corresponds to a dark section area of the projected pattern; and a deriving unit configured to derive three-dimensional coordinates of the object based on data of the captured image and the internal scattering light component estimated by the estimating unit.
地址 Tokyo JP