发明名称 METHOD OF INSPECTING BLANKING DEVICE FOR MULTIPLE CHARGED PARTICLE BEAM
摘要 PROBLEM TO BE SOLVED: To provide a method of inspecting a blanking device before the blanking device is mounted in a drawing device.SOLUTION: A blanking device inspecting method for inspecting a defective individual blanking mechanism of a blanking device containing plural individual blanking mechanism mounted in an array style for performing blanking control of beams, and at least one control circuit 43 that can selectively apply a positive potential and a ground potential to second electrodes of the plural individual blanking mechanisms, comprises a step of measuring a first current value flowing from a power source for supplying the voltage of the potential difference between the positive potential and the ground potential to each individual blanking mechanism under a state that the positive potential is applied from the control circuit 41 to the first electrode and the ground potential is applied from at least one control circuit 43 to the second electrode with respect to each individual blanking mechanism, and a step of determining that there exists an individual blanking mechanism in which short-circuit occurs when the measured fist current value is a finite value and is not more than a preset first threshold value.SELECTED DRAWING: Figure 3
申请公布号 JP2016054292(A) 申请公布日期 2016.04.14
申请号 JP20150167674 申请日期 2015.08.27
申请人 NUFLARE TECHNOLOGY INC 发明人 YAMASHITA HIROSHI
分类号 H01L21/027;H01J37/305 主分类号 H01L21/027
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