发明名称 Systems and methods for capturing artifact free images
摘要 The present disclosure is directed towards methods and systems for capturing artifact-free biometric images of an eye. The eye may be in motion and in the presence of partially-reflective eyewear. The method may include acquiring, by a first sensor, a first image of an eye while the eye is illuminated by a first illuminator. The first image may include a region of interest. The first sensor may be disposed at a fixed displacement from the first illuminator and a second sensor. The second sensor may acquire, within a predetermined period of time from the acquisition of the first image, a second image of the eye. The second image may include the region of interest. An image processor may determine if at least one of the first and second images include artifacts arising from one or both of the first illuminator and eyewear, within the region of interest.
申请公布号 US9311536(B2) 申请公布日期 2016.04.12
申请号 US201514629100 申请日期 2015.02.23
申请人 Eyelock LLC 发明人 Hanna Keith J.
分类号 G06K9/00;G06K9/46 主分类号 G06K9/00
代理机构 Foley & Lardner LLP 代理人 Foley & Lardner LLP ;Lanza John D.
主权项 1. A method of acquiring artifact-free biometric images of an eye in relative motion with a sensor, and in the presence of partially-reflective eyewear, comprising: (a) acquiring, by a first sensor, a first image of an eye while the eye is illuminated by a first illuminator, the first image including a region of interest, the first sensor disposed at a fixed displacement from the first illuminator and a second sensor; (b) acquiring, by the second sensor within a predetermined period of time from the acquisition of the first image, a second image of the eye, the second image including the region of interest; and (c) determining if at least one of the first and second images include an artifact within the region of interest arising from the first illuminator and eyewear, the artifact comprising a specular reflection off the eyewear within the region of interest and arising from the first illuminator.
地址 New York NY US
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