发明名称 パンタグラフ測定方法及びパンタグラフ測定装置
摘要 A pantograph measurement method by means of image processing comprising a process (S1) for acquiring a video image of a marker (50) disposed on a pantograph (40) and for generating a space-time image from the acquired video, and a process (S2) for searching for the marker (50) by comparing the search patterns in accordance with the height of the space-time image, wherein: the marker (50) has a stripe pattern in which a first region (51) that cannot easily reflect light and a second region (52) that can easily reflect light are alternately disposed, at least two second regions (52) are disposed, and the stripe width of the second regions are different from one another; and the search pattern corresponds to the stripe pattern of the marker.
申请公布号 JP5900018(B2) 申请公布日期 2016.04.06
申请号 JP20120043496 申请日期 2012.02.29
申请人 株式会社明電舎 发明人 渡部 勇介;庭川 誠
分类号 G01B11/00;B60L5/24 主分类号 G01B11/00
代理机构 代理人
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