| 发明名称 |
ALL VOLTAGE, TEMPERATURE AND PROCESS MONITOR CIRCUIT FOR MEMORIES |
| 摘要 |
A device for monitoring process variations across memory bitcells includes a bitcell inverter that provides an output voltage to be used for identifying skewed corners of the memory bitcells. A first comparator compares the output voltage with a first reference voltage, and a second comparator compares the output voltage with a second reference voltage. The first and the second comparators generate a corner code based on comparison results. |
| 申请公布号 |
US2016093399(A1) |
申请公布日期 |
2016.03.31 |
| 申请号 |
US201414534548 |
申请日期 |
2014.11.06 |
| 申请人 |
BROADCOM CORPORATION |
发明人 |
GUPTA Saket;ZHANG Yifei;MONZEL Carl;WINTER Mark Jon |
| 分类号 |
G11C29/04;G11C7/12 |
主分类号 |
G11C29/04 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A device for monitoring process variations across memory bitcells, the device comprising:
a bitcell inverter configured to provide an output voltage to be used for identifying skewed corners of the memory bitcells; a first comparator configured to compare the output voltage with a first reference voltage; and a second comparator configured to compare the output voltage with a second reference voltage, wherein the first and the second comparators are configured to generate a corner code based on comparison results, and wherein the first reference voltage is greater than the second reference voltage. |
| 地址 |
Irvine CA US |
