发明名称 SELF-TIMED SLC NAND PIPELINE AND CONCURRENT PROGRAM WITHOUT VERIFICATION
摘要 A hierarchical-GBL/LBL NAND array with a plurality of LG and MG groups in either orthogonal BL/CSL scheme or parallel BL/SL scheme including a plurality of block-decoders with a shared self-timed delay control circuit and a plurality of fully-shielding dynamic CACHE registers made of 2 local broken metal lines within the array and DRAM-like SA is provided. Each DCR capacitor is flexibly expandable by connecting multiple CLGs made by the local broken metal lines of the LGs to form a CMG of a larger MG. Based on the NAND array, multiple randomly selected WLs in multiple random blocks within multiple random LGs within one MG can be selected on basis of one WL per block per LG for performing an ABL pipeline and concurrent SLC program without verification, and on basis of one WL per block per MG for performing an ABL-like or HBL pipeline and concurrent SLC read.
申请公布号 US2016093384(A1) 申请公布日期 2016.03.31
申请号 US201514859237 申请日期 2015.09.18
申请人 Lee Peter Wung 发明人 Lee Peter Wung
分类号 G11C16/10;G11C16/32;G11C16/26;G11C16/34;G11C16/04;G11C16/08 主分类号 G11C16/10
代理机构 代理人
主权项 1. A NAND memory chip configured for pipeline/concurrent All-BL (ABL) SLC program without program-verify and ABL-like SLC read operations, the NAND memory chip comprising: a NAND array comprising J numbers of HG groups arranged in a bitline (BL) direction, each HG group including L numbers of MG groups, each MG group including J′ numbers of LG groups, each LG group including H numbers of blocks, each block including N numbers of strings cascaded one another in a wordline (WL) direction orthogonal to the BL-direction, each string comprising K numbers of NAND memory cells capped by a pair of string-select transistors respectively at two ends of the string having its source node connected to a common source line laid in the WL-direction, wherein N, J, L, J′, H, and K are integers of 2 and greater based on memory chip design; a two-level BL hierarchical structure comprising N/2 first metal lines laid at a first level as global bit lines (GBLs) in the BL-direction through the NAND array and broken by J−1 rows of N/2 GBL-dividers forming a set of N/2 broken-GBLs associated with one of J HG groups, and comprising N second metal lines laid below the first level as local bit lines (LBLs) in the BL-direction through each MG group forming one page of N-bit on-chip capacitors CMGs, each pair of Odd and Even LBLs being connected to one GBL via a 2-to-1 MG-Ypass device, each of the N LBLs being divided to J′ pages of N broken-LBLs by J′−1 rows of N LBL-dividers, each page of N broken-LBLs being associated with a LG group as one page of N-bit parasitic capacitors CLGs and respectively connecting to drain nodes of N strings of each block of the LG group wherein N/2 Odd-numbered broken-LBLs and N/2 Even-numbered broken-LBLs are commonly connected to a precharge power line respectively via N/2 Odd-precharger devices and N/2 Even-precharger devices for charging a medium-high voltage Vinh of about 7V or lower or discharging to ground or other small voltages; a plurality of group-decoders including BHG-DEC, MG-DEC, BLG-DEC, and LG-based precharge power line decoder for providing respective gate control signals; a row-decoder control circuit including a plurality of LG-based row-decoders, each LG-based row-decoder including a time control unit and H block-decoders, each block-decoder being configured to provide line control signals for K WLs of NAND cells and a pair of gate lines of string-select transistors per block; a peripheral system comprising a data communication group and a command control group, the data communication group including a N/2-bit page buffer circuit coupled between the N/2 GBLs and I/Os for program data loading and read data sensing, the command control group including a command interface, a state-machine circuit, an address register circuit, and a voltage generator for receiving/transmitting external control signals, controlling I/Os to operate the page buffer operated with a low Vdd operating voltage, and generating various required high, medium, and analog low voltages and address information for the row-decoder control circuit and the plurality of group-decoders to set desired bias conditions for performing multi-WLs pipeline/concurrent ABL SLC program without program-verify and ABL-like read operation with substantial reduction in operation latency.
地址 Saratoga CA US