| 摘要 |
PROBLEM TO BE SOLVED: To provide a novel inspection apparatus.SOLUTION: The inspection apparatus includes an illuminating device irradiating an object to be picked up with light, an imaging apparatus receiving the light reflected from the object to be picked up based on the irradiation with the light, and an imaging element existing in the imaging apparatus and receiving the reflected light. The inspection apparatus is the inspection apparatus acquiring one or both of the two-dimensional image and three-dimensional image of the object to be picked up. An imaging area is provided in the imaging element. The imaging area receives the reflected light. Further, a bandpass filter is provided on the imaging area. |
