发明名称 Undulation detection device and method
摘要 An undulation detection device includes a two-dimensional sensor configured to emit a sensing wave for distance measurement in a plurality of directions forming different lateral and vertical angles and to measure respective distances to objects from which the sensing wave is reflected, and a processor performs detecting an undulation of the measurement surface or an obstacle placed on the measurement surface from which the sensing wave is reflected, on the basis of a difference among the distances in the different directions, the difference being measured by the two-dimensional sensor, and outputting an undulation detection report, when an in-plane size of the undulation of the measurement surface or the obstacle placed on the measurement surface is equal to or more than a threshold.
申请公布号 US9291452(B2) 申请公布日期 2016.03.22
申请号 US201313772437 申请日期 2013.02.21
申请人 FUJITSU LIMITED 发明人 Kasama Kouichirou
分类号 G01B21/20;G01B15/08 主分类号 G01B21/20
代理机构 Maschoff Brennan 代理人 Maschoff Brennan
主权项 1. An undulation detection device comprising: a two-dimensional sensor configured to emit a sensing wave for distance measurement in a plurality of directions forming different lateral and vertical angles and to measure respective distances to objects from which the sensing wave is reflected; and a processor performs: detecting an undulation of a measurement surface or an obstacle placed on the measurement surface from which the sensing wave is reflected, on the basis of a difference among the distances in the different directions, the difference being measured by the two-dimensional sensor; and outputting an undulation detection report, when a size of the undulation of the measurement surface or the obstacle placed on the measurement surface is equal to or more than a threshold.
地址 Kawasaki JP