发明名称 金属シリサイド層の製造方法
摘要 According to one embodiment, a method of manufacturing a metal silicide layer, the method includes forming a metal layer including impurities on a silicon layer by a vapor deposition method using a gas of a metal and a gas of the impurities, and forming a metal silicide layer including the impurities by chemically reacting the metal layer with the silicon layer. A thickness and a composition of the metal silicide layer are controlled by an amount of the impurities in the metal layer.
申请公布号 JP5889821(B2) 申请公布日期 2016.03.22
申请号 JP20130062428 申请日期 2013.03.25
申请人 株式会社東芝 发明人 本多 亮
分类号 H01L21/28;C23C16/42;H01L21/285;H01L21/336;H01L21/8247;H01L27/115;H01L29/78;H01L29/788;H01L29/792 主分类号 H01L21/28
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