发明名称 DATA PATTERN DETECTING DEVICE, SEMICONDUCTOR DEVICE INCLUDING THE SAME AND OPERATING METHOD THEREOF
摘要 According to an embodiment of the present invention, a data pattern detecting device comprises: a length comparing unit for comparing the length of compressed input data with that of compressed pattern data; and a data comparing unit for comparing the compressed input data with the compressed pattern data.
申请公布号 KR20160031169(A) 申请公布日期 2016.03.22
申请号 KR20140120794 申请日期 2014.09.12
申请人 SK HYNIX INC.;IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) 发明人 KIM, DONG WOOK;KANG, SOO YONG
分类号 G06F17/00;G06F12/02 主分类号 G06F17/00
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