发明名称 |
DATA PATTERN DETECTING DEVICE, SEMICONDUCTOR DEVICE INCLUDING THE SAME AND OPERATING METHOD THEREOF |
摘要 |
According to an embodiment of the present invention, a data pattern detecting device comprises: a length comparing unit for comparing the length of compressed input data with that of compressed pattern data; and a data comparing unit for comparing the compressed input data with the compressed pattern data. |
申请公布号 |
KR20160031169(A) |
申请公布日期 |
2016.03.22 |
申请号 |
KR20140120794 |
申请日期 |
2014.09.12 |
申请人 |
SK HYNIX INC.;IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) |
发明人 |
KIM, DONG WOOK;KANG, SOO YONG |
分类号 |
G06F17/00;G06F12/02 |
主分类号 |
G06F17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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