发明名称 ETCHING METHOD AND ETCHING APPARATUS
摘要 An etching method for performing a plasma etching on an object to be processed by using a supplied gas is provided. In the etching method, a temperature of a focus ring is adjusted by using a first temperature adjustment mechanism controllable independently of a temperature control of the object to be processed while measuring a time variation until the temperature of the focus ring reaches a target value. A degree of consumption of the focus ring is estimated from the measured time variation based on a preliminarily set correlation between the time variation and the degree of consumption of the focus ring. The target value of the temperature of the focus ring is corrected based on the estimated degree of consumption of the focus ring.
申请公布号 US2016079074(A1) 申请公布日期 2016.03.17
申请号 US201414785392 申请日期 2014.05.21
申请人 TOKYO ELECTRON LIMITED 发明人 TOYODA Keigo;ISAGO Masaru;TSUJIMOTO Hiroshi
分类号 H01L21/3065;H01L21/67;H01J37/32;H01L21/66 主分类号 H01L21/3065
代理机构 代理人
主权项 1. An etching method for performing a plasma etching on an object to be processed by using a supplied gas, comprising steps of: adjusting a temperature of a focus ring by using a first temperature adjustment mechanism controllable independently of a temperature control of the object to be processed while measuring a time variation until the temperature of the focus ring reaches a target value; estimating a degree of consumption of the focus ring from the measured time variation based on a preliminarily set correlation between the time variation and the degree of consumption of the focus ring; and correcting the target value of the temperature of the focus ring based on the estimated degree of consumption of the focus ring.
地址 Tokyo JP