| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a measuring method of an optical interference element capable of obtaining optical characteristics of an arm. <P>SOLUTION: An optical interference element comprises: an input coupler; first and second semiconductor arms connected to the input coupler; and an output coupler for interfering with output of the first and second semiconductor arms. A measuring method of the optical interference element includes the steps of: sweeping a bias voltage of the second semiconductor arm and obtaining an output state of the output coupler after causing a state of the first semiconductor arm to be switched to a light transmission state; and sweeping the bias voltage of the second semiconductor arm in a state that a bias voltage causing the first semiconductor arm to generate optical absorption characteristics greater in comparison with those in the light transmission state is applied thereto and obtaining the output state of the output coupler. <P>COPYRIGHT: (C)2013,JPO&INPIT |
