发明名称 |
SPECIMEN PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY |
摘要 |
A TEM specimen kit is disclosed, which comprises: (a) a top substrate and a bottom substrate, the top and the bottom substrates being transparent and substantially parallel to each other; (b) a first spacer and a second spacer, located beneath the top substrate and sitting on the bottom substrate, the second spacer being opposite to and spaced apart from the first spacer at a distance of d; and (c) a chamber formed between the top and bottom substrate and between the first and second spacer, the chamber having two ends open to the atmosphere and characterized by having a height defined by the thickness h of the spacer, wherein the height being smaller than the diameter of a red blood cell. Also enclosed are methods for preparing a dry specimen for TEM nanoparticle characterization, and methods for analyzing TEM images of nanoparticles in a liquid sample. |
申请公布号 |
EP2870104(A4) |
申请公布日期 |
2016.03.02 |
申请号 |
EP20130817049 |
申请日期 |
2013.07.08 |
申请人 |
NATIONAL HEALTH RESEARCH INSTITUTES;MATERIALS ANALYSIS TECHNOLOGY (US) CORP. |
发明人 |
HSIEH, YONG-FEN;CHU, CHIH-HSUN;SHARMA, PRADEEP;KO, YU-FENG;YANG, CHUNG-SHI;TAI, LIN-AI;CHEN, YU-CHING;TING, HSIAO-CHUN |
分类号 |
B82Y35/00;H01J37/20 |
主分类号 |
B82Y35/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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