发明名称 |
Systems and methods for a wafer scale atomic clock |
摘要 |
Systems and methods for a wafer scale atomic clock are provided. In at least one embodiment, a wafer scale device comprises a first substrate; a cell layer joined to the first substrate, the cell layer comprising a plurality of hermetically isolated cells, wherein separate measurements are produced for each cell in the plurality of hermetically isolated cells; and a second substrate joined to the cell layer, wherein the first substrate and the second substrate comprise electronics to control the separate measurements, wherein the separate measurements are combined into a single measurement. |
申请公布号 |
EP2866102(A3) |
申请公布日期 |
2016.03.02 |
申请号 |
EP20140186056 |
申请日期 |
2014.09.23 |
申请人 |
HONEYWELL INTERNATIONAL INC. |
发明人 |
KRIZ, JEFFREY JAMES;TUCKER, JAMES L.;HEFFNER, KENNETH H.;COMPTON, ROBERT |
分类号 |
G04F5/14 |
主分类号 |
G04F5/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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