发明名称 |
CHUNK POLYCRYSTALLINE SILICON AND PROCESS FOR CLEANING POLYCRYSTALLINE SILICON CHUNKS |
摘要 |
The invention provides chunk polycrystalline silicon having a concentration of carbon at the surface of 0.5-35 ppbw. A process for cleaning polycrystalline silicon chunks having carbon contaminations at the surface, includes a thermal treatment of the polycrystalline silicon chunks in a reactor at a temperature of 350 to 600° C., the polycrystalline silicon chunks being present in an inert gas atmosphere during the thermal treatment, and the polycrystalline silicon chunks after the thermal treatment having a concentration of carbon at the surface of 0.5-35 ppbw. |
申请公布号 |
US2016052790(A1) |
申请公布日期 |
2016.02.25 |
申请号 |
US201514927779 |
申请日期 |
2015.10.30 |
申请人 |
Wacker Chemie AG |
发明人 |
TRAUNSPURGER Gerhard;FABRY Laszlo;PECH Reiner |
分类号 |
C01B33/02 |
主分类号 |
C01B33/02 |
代理机构 |
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代理人 |
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主权项 |
1. Chunk polycrystalline silicon having a concentration of carbon of 0.5-35 ppbw at a surface thereof. |
地址 |
Muenchen DE |