发明名称 OXIDE FILM SCHEME FOR RRAM STRUCTURE
摘要 The present invention relates to a method for forming an RRAM cell having a dielectric data layer providing excellent performance, device yield, and data maintenance, and an apparatus related thereto. In some embodiments, the method is performed by forming an RRAM membrane stack having a bottom electrode layer arranged on a semiconductor substrate, an upper electrode layer, and a dielectric data memory layer arranged between the bottom electrode layer and the upper electrode layer. The dielectric data memory layer has a performance reinforcing layer having a hydrogen-doped oxide, a data maintaining layer having aluminum oxide. The next RRAM membrane stack is patterned along one or more masking layers for forming an upper electrode and a bottom electrode, and formed at the position where an upper metal interconnection layer is electrically contacting with the upper electrode.
申请公布号 KR20160021005(A) 申请公布日期 2016.02.24
申请号 KR20140174844 申请日期 2014.12.08
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 DANG TRINH HAI;LIN HSING LIEN;TSAI CHENG YUAN;TSAI CHIA SHIUNG;LEE RU LIANG
分类号 H01L27/115;H01L29/786 主分类号 H01L27/115
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