发明名称 CMP COMPOSITION CONTAINING ZIRCONIA PARTICLES AND METHOD OF USE
摘要 The invention provides a chemical-mechanical polishing composition containing zirconia particles, a modifying agent that adheres to the zirconia particles, an organic acid, and water, as well as a method of using such a polishing composition to polish substrates and a method of using a polishing composition comprising zirconia particles, an organic acid, an oxidizing agent, and water to polishing substrates containing metal and oxide-based dielectric materials.
申请公布号 EP2852650(A4) 申请公布日期 2016.02.24
申请号 EP20130793438 申请日期 2013.05.21
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 JIN, WIECHANG;PARKER, JOHN;REMSEN, ELIZABETH
分类号 C09K3/14;C09G1/02;C23F3/06;H01L21/3105;H01L21/321 主分类号 C09K3/14
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