发明名称 Optical sensor and image forming apparatus
摘要 In an optical sensor, a light emission system emits an irradiated light of a linear polarization in a first polarization direction toward a surface of a target object having a sheet shape from an incident direction which is inclined with respect to a normal direction of the surface. A first light detection system includes a first light detector arranged on a first light path of a specular reflected light, which is emitted from the light emission system and is specularly reflected from the target object. A second light detection system includes a second light detector arranged on a second light path of a diffuse reflected light which is diffusely reflected from an incident plane on the target object. The second light detector receives second light passed by an optical element which passes a linear polarization component of a second polarization direction perpendicular to the first polarization direction.
申请公布号 US9267886(B2) 申请公布日期 2016.02.23
申请号 US201113879451 申请日期 2011.11.25
申请人 RICOH COMPANY, LTD. 发明人 Ohba Yoshihiro;Sugawara Satoru;Ishii Toshihiro;Hoshi Fumikazu
分类号 G01J4/00;H04L12/28;G02B26/10;B60Q1/26;F21V1/00;H01J3/14;G01J1/42;G01N21/55;G01N21/47;G01B11/06;G01N21/21;G01N21/57;G03G15/00 主分类号 G01J4/00
代理机构 Cooper & Dunham LLP 代理人 Cooper & Dunham LLP
主权项 1. An optical sensor, comprising: a light emission system configured to emit an irradiated light of a linear polarization in a first polarization direction toward a surface of a target object having a sheet shape from an incident direction which is inclined with respect to a normal direction of the surface; a first light detection system configured to include a first light detector arranged on a first light path of a specular reflected light, which is emitted from the light emission system and is specularly reflected from the target object; a second light detection system configured to include a second light detector arranged on a second light path of a diffuse reflected light which is diffusely reflected from an incident plane on the target object, the second light detector receiving second light passed by an optical element which passes a linear polarization component of a second polarization direction perpendicular to the first polarization direction; a third light detection system configured to include at least one third light detector arranged on a third light path of a diffuse reflected light which is diffusely reflected from the incident plane on the target object without passing the optical element, wherein the second light detection system and the third light detection system are arranged on paths different from the first light path of the specular reflected light which is emitted from the light emission system and is specularly reflected from the target object.
地址 Tokyo JP
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