发明名称 |
FORMING TRANSISTORS WITHOUT SPACERS AND RESULTING DEVICES |
摘要 |
Methods for forming gates without spacers and the resulting devices are disclosed. Embodiments may include forming a channel layer on a substrate; forming a dummy gate on the channel layer; forming an interlayer dielectric (ILD) on the channel layer and surrounding the dummy gate; forming a trench within the ILD and the channel layer by removing the dummy gate and the channel layer below the dummy gate; forming an un-doped channel region at the bottom of the trench; and forming a gate above the un-doped channel region within the trench. |
申请公布号 |
US2016049494(A1) |
申请公布日期 |
2016.02.18 |
申请号 |
US201414461713 |
申请日期 |
2014.08.18 |
申请人 |
GLOBALFOUNDRIES Inc. |
发明人 |
ZSCHÄTZSCH Gerd;FLACHOWSKY Stefan;HOENTSCHEL Jan |
分类号 |
H01L29/66;H01L21/02;H01L21/265;H01L29/78 |
主分类号 |
H01L29/66 |
代理机构 |
|
代理人 |
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主权项 |
1. A method comprising:
forming a channel layer on a substrate; forming a dummy gate on the channel layer; forming an interlayer dielectric (ILD) on the channel layer and surrounding the dummy gate; forming a trench within the ILD and the channel layer by removing the dummy gate and the channel layer below the dummy gate; forming an un-doped channel region at the bottom of the trench; conformally forming a high-k dielectric layer within the trench after forming the un-doped channel region; filling the trench with a metal to form a gate above the un-doped channel region, wherein the gate does not include spacers and the ILD is in direct contact with the high-k dielectric layer. |
地址 |
Grand Cayman KY |