发明名称 FORMING TRANSISTORS WITHOUT SPACERS AND RESULTING DEVICES
摘要 Methods for forming gates without spacers and the resulting devices are disclosed. Embodiments may include forming a channel layer on a substrate; forming a dummy gate on the channel layer; forming an interlayer dielectric (ILD) on the channel layer and surrounding the dummy gate; forming a trench within the ILD and the channel layer by removing the dummy gate and the channel layer below the dummy gate; forming an un-doped channel region at the bottom of the trench; and forming a gate above the un-doped channel region within the trench.
申请公布号 US2016049494(A1) 申请公布日期 2016.02.18
申请号 US201414461713 申请日期 2014.08.18
申请人 GLOBALFOUNDRIES Inc. 发明人 ZSCHÄTZSCH Gerd;FLACHOWSKY Stefan;HOENTSCHEL Jan
分类号 H01L29/66;H01L21/02;H01L21/265;H01L29/78 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method comprising: forming a channel layer on a substrate; forming a dummy gate on the channel layer; forming an interlayer dielectric (ILD) on the channel layer and surrounding the dummy gate; forming a trench within the ILD and the channel layer by removing the dummy gate and the channel layer below the dummy gate; forming an un-doped channel region at the bottom of the trench; conformally forming a high-k dielectric layer within the trench after forming the un-doped channel region; filling the trench with a metal to form a gate above the un-doped channel region, wherein the gate does not include spacers and the ILD is in direct contact with the high-k dielectric layer.
地址 Grand Cayman KY