发明名称 |
Techniques for forming non-planar germanium quantum well devices |
摘要 |
Techniques are disclosed for forming a non-planar germanium quantum well structure. In particular, the quantum well structure can be implemented with group IV or III-V semiconductor materials and includes a germanium fin structure. In one example case, a non-planar quantum well device is provided, which includes a quantum well structure having a substrate (e.g. SiGe or GaAs buffer on silicon), a IV or III-V material barrier layer (e.g., SiGe or GaAs or AlGaAs), a doping layer (e.g., delta/modulation doped), and an undoped germanium quantum well layer. An undoped germanium fin structure is formed in the quantum well structure, and a top barrier layer deposited over the fin structure. A gate metal can be deposited across the fin structure. Drain/source regions can be formed at respective ends of the fin structure. |
申请公布号 |
US9263557(B2) |
申请公布日期 |
2016.02.16 |
申请号 |
US201314069880 |
申请日期 |
2013.11.01 |
申请人 |
Intel Corporation |
发明人 |
Pillarisetty Ravi;Kavalieros Jack T.;Rachmady Willy;Shah Uday;Chu-Kung Benjamin;Radosavljevic Marko;Mukherjee Niloy;Dewey Gilbert;Jin Been-Yih;Chau Robert S. |
分类号 |
H01L29/66;B82Y10/00;H01L29/267;H01L29/775;H01L29/778;H01L21/76;H01L29/78;H01L29/10;H01L29/51 |
主分类号 |
H01L29/66 |
代理机构 |
Finch & Maloney PLLC |
代理人 |
Finch & Maloney PLLC |
主权项 |
1. A method of forming a non-planar semiconductor device, the method comprising:
selectively etching a quantum well structure to form an active body structure, the quantum well structure having a substrate, a IV or III-V material barrier layer, a doping layer, and a germanium quantum well layer; depositing a top barrier layer of semiconductor material over at least a portion of the active body structure, wherein the top barrier layer covers top and sidewall portions of the active body structure; and forming a gate structure across at least a portion of the top barrier layer, including depositing a gate dielectric. |
地址 |
Santa Clara CA US |