发明名称 Method and apparatus for supply voltage glitch detection in a monolithic integrated circuit device
摘要 A monolithic integrated circuit device may include a supply voltage glitch detector (10) for detecting improper supply voltage conditions. Advantageously, the detection threshold of the supply voltage glitch detector is adaptively set based on the mode of operation of the device or a particular part of the device, which is internally known to the device based on certain inputs received by the device, such as commands, interrupts, control signals, and so forth.
申请公布号 EP2982997(A1) 申请公布日期 2016.02.10
申请号 EP20140179710 申请日期 2014.08.04
申请人 WINBOND ELECTRONICS CORP. 发明人 TASHER, NIR;TEPER, VALERY;CHENG, DENNIS CHIN;HUANG, KOYING
分类号 G01R31/28;G01R19/165;G01R19/25;G01R19/30;G01R31/30;G01R31/317 主分类号 G01R31/28
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