发明名称 Thin Active Layer Fishbone Photodiode With A Shallow N+ Layer and Method of Manufacturing the Same
摘要 The present invention is directed toward a detector structure, detector arrays, and a method of detecting incident radiation. The present invention comprises a photodiode array and method of manufacturing a photodiode array that provides for reduced radiation damage susceptibility, decreased affects of crosstalk, reduced dark current (current leakage) and increased flexibility in application.
申请公布号 US2016035778(A1) 申请公布日期 2016.02.04
申请号 US201514685492 申请日期 2015.04.13
申请人 OSI Optoelectronics, Inc. 发明人 Bui Peter Steven;Taneja Narayan Dass
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项 1. A photodiode array comprising: a thin active layer substrate having at least a front side and a back side; a plurality of photodiodes integrally formed in the thin active layer substrate forming said array; a plurality of metal contacts provided on said front side, wherein the fabrication of said array comprises: coating said front side and said back side of said substrate with an oxide layer via mask oxidation;coating said front side of said substrate with a photoresist layer;masking said front side of said substrate with a p+ lithography mask;selectively etching the oxide layer on said front side said substrate wafer, wherein the p+ lithography mask is used to reveal p+ diffusion regions on said front side and etching the oxide coating on said back side of said substrate completely;diffusing a p+ layer on said front side of said substrate forming p+ diffusion regions;applying a drive-in oxidation layer on said front side of said substrate;coating said front side of said substrate with a photoresist layer;masking said front side of said substrate with a n+ lithography mask to form at least one active area etch pattern;selectively etching the photoresist layer on said front side of said substrate using said active area etch pattern to reveal n+ diffusion regions on said front side;diffusing a n+ layer on said front side of said substrate forming shallow n+ regions between adjacent p+ regions;performing a drive-in oxidation on said front side of said substrate;coating at least one exposed surface on said front side of said substrate with an oxide layer;coating said front side of said substrate with a silicon nitride layer;coating said front side of said substrate with a photoresist layer;masking said front side of said substrate wafer using a contact window mask;selectively etching the front side of the substrate using said contact window mask to form at least one contact window;metallizing said front side and said back side of said substrate;coating said front side of said substrate with a photoresist layer; andmasking and selectively etching said front side of said substrate to form metal contacts.
地址 Hawthorne CA US