发明名称 Scattering Detection from Downhole Optical Spectra
摘要 Obtaining in-situ, at a first time, first optical spectral data associated with a formation fluid flowing through a downhole formation fluid sampling apparatus, and then obtaining in-situ, at a second time after the first time, second optical spectral data associated with the formation fluid flowing through the downhole formation fluid sampling apparatus. A wavelength-independent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus is then determined based on the first and second optical spectral data, and a wavelength-dependent scattering intensity within the formation fluid flowing through the downhole formation fluid sampling apparatus is determined based on the first and second optical spectral data.
申请公布号 US2016032721(A1) 申请公布日期 2016.02.04
申请号 US201514884623 申请日期 2015.10.15
申请人 Schlumberger Technology Corporation 发明人 Hsu Kai;Indo Kentaro;Pop Julian
分类号 E21B49/08 主分类号 E21B49/08
代理机构 代理人
主权项 1. A method comprising: operating a downhole acquisition tool in a wellbore in a geological formation, wherein the wellbore or the geological formation, or both contain a fluid that comprises a native reservoir fluid of the geological formation and a contaminant; receiving a portion of the fluid into the downhole acquisition tool; measuring a fluid property of the fluid using the downhole acquisition tool, wherein the fluid property includes a first optical density of a first portion of the fluid at a first wavelength and a second optical density of a second portion of the fluid at a second wavelength, wherein the first and second optical densities are measured at successive times; and using one or more processors to: determine a scattering intensity of the first and second portions of the fluid using the first and second optical densities;estimate a saturation pressure of the fluid using the scattering intensity; andadjust an operational parameter of the downhole acquisition tool based on a relationship between the operational parameter and the saturation pressure.
地址 Sugar Land TX US
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