发明名称 イオンビームシステム及びイオンビームシステムを操作する方法
摘要 An ion beam system comprises a voltage supply system (7) and at least one beam deflector (39) having at least one first deflection electrode (51a,51b,51c) and plural second deflection electrodes (52a,52b,52c), wherein the voltage supply system is configured to supply different adjustable deflection voltages to the plural second deflection electrodes such that electric deflection fields between the plural second deflection electrodes and the opposite at least one first deflection electrode have a common orientation. The system has a high kinetic energy mode in which a distribution of the electric deflection field has a greater width, a low kinetic energy mode in which a distribution of the electric deflection field has a smaller width.
申请公布号 JP5852833(B2) 申请公布日期 2016.02.03
申请号 JP20110219560 申请日期 2011.10.03
申请人 カール ツァイス マイクロスコーピー ゲーエムベーハーCarl Zeiss Microscopy GmbH 发明人 ヨゼフ ビバーガー;ラルフ プルウェイ;アンドレアス アドルフ
分类号 H01J37/147;H01J37/28;H01J37/317 主分类号 H01J37/147
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