发明名称 |
MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE |
摘要 |
The present invention provides a semiconductor device with high aperture ratio or a manufacturing method thereof. Also, the present invention provides a semiconductor device with low power consumption or a manufacturing method thereof. The semiconductor device comprises: a conductive layer having translucency functioning as a gate electrode; a gate insulation film which is formed on the conductive layer having the translucency; a semiconductor layer over the gate insulation film on the conductive layer functioning as the gate electrode; and a conductive layer having translucency functioning as a source electrode or a drain electrode electrically connected to the semiconductor layer. |
申请公布号 |
KR20160009078(A) |
申请公布日期 |
2016.01.25 |
申请号 |
KR20160000821 |
申请日期 |
2016.01.05 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
KIMURA HAJIME |
分类号 |
H01L29/786;G02F1/1368;H01L21/28;H01L21/3205;H01L21/336;H01L21/768;H01L23/522;H01L27/12;H01L29/417;H01L29/423;H01L29/49 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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