发明名称 MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE
摘要 The present invention provides a semiconductor device with high aperture ratio or a manufacturing method thereof. Also, the present invention provides a semiconductor device with low power consumption or a manufacturing method thereof. The semiconductor device comprises: a conductive layer having translucency functioning as a gate electrode; a gate insulation film which is formed on the conductive layer having the translucency; a semiconductor layer over the gate insulation film on the conductive layer functioning as the gate electrode; and a conductive layer having translucency functioning as a source electrode or a drain electrode electrically connected to the semiconductor layer.
申请公布号 KR20160009078(A) 申请公布日期 2016.01.25
申请号 KR20160000821 申请日期 2016.01.05
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 KIMURA HAJIME
分类号 H01L29/786;G02F1/1368;H01L21/28;H01L21/3205;H01L21/336;H01L21/768;H01L23/522;H01L27/12;H01L29/417;H01L29/423;H01L29/49 主分类号 H01L29/786
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