METHOD AND APPARATUS FOR MEASURING OPTICAL SYSTEMS AND SURFACES WITH OPTICAL RAY METROLOGY

摘要

Systems and methods for measuring an optical system are provided. A method of measuring an optical system includes the steps of: illuminating the optical system using a modulated diffuse optical source; simultaneously imaging light that has been altered by the optical system using a plurality of sensors positioned at different vantage points; determining, based on images from each of the sensors, the mapping relations between points on the optical system and corresponding geometric locations of points in the diffuse optical source; and determining, based on the mapping relations for each of the sensors, properties of the optical system.