发明名称 METHOD TO DETERMINE ADHESION OF FILM TO SUBSTRATE
摘要 FIELD: measurement equipment.SUBSTANCE: they observe the formation of a dome in the process of even internal pressure supply, the form of the base (breakaway contour) of the dome is taken as elliptical with an account of anisotropic features of the adhesive and anisotropy of the film material, they measure the current height of the dome lift and current dimensions of large and small half-axes of the dome base, they determine the mechanical stress of the breakaway according to the formula, by the calculated values of the mechanical stress of the breakaway they decide on adhesive properties of the film to a substrate.EFFECT: increased accuracy for the determination of adhesion parameters.2 cl, 4 dwg, 2 tbl, 1 ex
申请公布号 RU2572673(C1) 申请公布日期 2016.01.20
申请号 RU20140145390 申请日期 2014.11.11
申请人 FEDERAL'NOE GOSUDARSTVENNOE BJUDZHETNOE UCHREZHDENIE NAUKI INSTITUT MEKHANIKI I MASHINOSTROENIJA KAZANSKOGO NAUCHNOGO TSENTRA ROSSIJSKOJ AKADEMII NAUK (FGBUN IMM KAZNTS RAN);JAKUPOV SAMAT NUKHOVICH 发明人 JAKUPOV SAMAT NUKHOVICH
分类号 G01N19/04 主分类号 G01N19/04
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