发明名称 |
CIRCUIT BOARD AND METHOD FOR PLACEMENT STATE TEST OF ELECTRONIC COMPONENT USING CIRCUIT BOARD |
摘要 |
PROBLEM TO BE SOLVED: To provide a circuit board and a method for a placement state test of an electronic component using a circuit board.SOLUTION: A method for a placement state test of an electronic component includes the steps of: providing a circuit board including a bonding pad 250 which includes a first pat 251 and a second pad 252 formed to be separated from the first pad 251 and on which an electronic component 300 is mounted; mounting the electronic component 300 on the bonding pad; and performing an electric test between the first pad 251 and the second pad 252 to test a placement state of the electronic component 300. |
申请公布号 |
JP2016009864(A) |
申请公布日期 |
2016.01.18 |
申请号 |
JP20150085697 |
申请日期 |
2015.04.20 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO LTD |
发明人 |
KIM CHANG HYUN;CHO KYOUNG SEOK |
分类号 |
H05K1/11;H05K3/34;H05K13/08 |
主分类号 |
H05K1/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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