发明名称 CIRCUIT BOARD AND METHOD FOR PLACEMENT STATE TEST OF ELECTRONIC COMPONENT USING CIRCUIT BOARD
摘要 PROBLEM TO BE SOLVED: To provide a circuit board and a method for a placement state test of an electronic component using a circuit board.SOLUTION: A method for a placement state test of an electronic component includes the steps of: providing a circuit board including a bonding pad 250 which includes a first pat 251 and a second pad 252 formed to be separated from the first pad 251 and on which an electronic component 300 is mounted; mounting the electronic component 300 on the bonding pad; and performing an electric test between the first pad 251 and the second pad 252 to test a placement state of the electronic component 300.
申请公布号 JP2016009864(A) 申请公布日期 2016.01.18
申请号 JP20150085697 申请日期 2015.04.20
申请人 SAMSUNG ELECTRO-MECHANICS CO LTD 发明人 KIM CHANG HYUN;CHO KYOUNG SEOK
分类号 H05K1/11;H05K3/34;H05K13/08 主分类号 H05K1/11
代理机构 代理人
主权项
地址