发明名称 |
UNEVENNESS INSPECTION SYSTEM, UNEVENNESS INSPECTION METHOD, AND UNEVENNESS INSPECTION PROGRAM |
摘要 |
An unevenness inspection system includes: an image pickup section configured to acquire a picked-up image of an inspection target; an image generation section configured to generate a color-unevenness inspection image and a luminance-unevenness inspection image, based on the picked-up image; a calculation section configured to use both of the color-unevenness inspection image and the luminance-unevenness inspection image to calculate an evaluation parameter; and an inspection section configured to use the calculated evaluation parameter to perform unevenness inspection. The image generation section performs image separation processing to separate a color component and a luminance component on the picked-up image, to generate a color-component image and a luminance-component image, and individually performs filter processing taking account of visual spatial frequency characteristics on the color-component image and the luminance-component image to respectively generate the color-unevenness inspection image and the luminance-unevenness inspection image, based on the filter-processed color-component image and the filter-processed luminance-component image. The calculation section calculates the evaluation parameter in consideration of unevenness visibility with respect to both of color and luminance. |
申请公布号 |
US2016011121(A1) |
申请公布日期 |
2016.01.14 |
申请号 |
US201414769384 |
申请日期 |
2014.02.18 |
申请人 |
SONY CORPORATION |
发明人 |
TOMIOKA Satoshi |
分类号 |
G01N21/88;H04N9/07 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
1. An unevenness inspection system comprising:
an image pickup section configured to acquire a picked-up image of an inspection target; an image generation section configured to generate a color-unevenness inspection image and a luminance-unevenness inspection image, based on the picked-up image; a calculation section configured to use both of the color-unevenness inspection image and the luminance-unevenness inspection image to calculate an evaluation parameter; and an inspection section configured to use the calculated evaluation parameter to perform unevenness inspection, wherein the image generation section performs image separation processing to separate a color component and a luminance component on the picked-up image, to generate a color-component image and a luminance-component image, and individually performs filter processing taking account of visual spatial frequency characteristics on the color-component image and the luminance-component image to respectively generate the color-unevenness inspection image and the luminance-unevenness inspection image, based on the filter-processed color-component image and the filter-processed luminance-component image, and the calculation section calculates the evaluation parameter in consideration of unevenness visibility with respect to both of color and luminance. |
地址 |
Minato-ku, Tokyo JP |