发明名称 Integrated circuit package with thermal neutron shielding
摘要 A semiconductor package with thermal neutron shielding is disclosed. The semiconductor package includes a substrate and an integrated circuit die disposed on the substrate. The semiconductor package also has a thermal neutron shield including a shielding material. The shielding material includes boron-10 and is configured to inhibit a portion of thermal neutrons that encounter the thermal neutron shield from passing through the thermal neutron shield.
申请公布号 US9236354(B2) 申请公布日期 2016.01.12
申请号 US201414257853 申请日期 2014.04.21
申请人 XILINX, INC. 发明人 Maillard Pierre;Barton Jeffrey;Lesea Austin H.
分类号 H01L23/552 主分类号 H01L23/552
代理机构 代理人 Maunu LeRoy D.
主权项 1. A semiconductor package, comprising: a substrate; a first integrated circuit die disposed on the substrate; a thermal neutron shield including a shielding material having a thickness and a concentration of boron-10 sufficient to prevent at least 50 percent of thermal neutrons that encounter the thermal neutron shield from passing through the thermal neutron shield; and wherein the thermal neutron shield includes a layer of underfill material including the shielding material, and the underfill material affixes the first integrated circuit die to the substrate.
地址 San Jose CA US