发明名称 |
Integrated circuit package with thermal neutron shielding |
摘要 |
A semiconductor package with thermal neutron shielding is disclosed. The semiconductor package includes a substrate and an integrated circuit die disposed on the substrate. The semiconductor package also has a thermal neutron shield including a shielding material. The shielding material includes boron-10 and is configured to inhibit a portion of thermal neutrons that encounter the thermal neutron shield from passing through the thermal neutron shield. |
申请公布号 |
US9236354(B2) |
申请公布日期 |
2016.01.12 |
申请号 |
US201414257853 |
申请日期 |
2014.04.21 |
申请人 |
XILINX, INC. |
发明人 |
Maillard Pierre;Barton Jeffrey;Lesea Austin H. |
分类号 |
H01L23/552 |
主分类号 |
H01L23/552 |
代理机构 |
|
代理人 |
Maunu LeRoy D. |
主权项 |
1. A semiconductor package, comprising:
a substrate; a first integrated circuit die disposed on the substrate; a thermal neutron shield including a shielding material having a thickness and a concentration of boron-10 sufficient to prevent at least 50 percent of thermal neutrons that encounter the thermal neutron shield from passing through the thermal neutron shield; and wherein the thermal neutron shield includes a layer of underfill material including the shielding material, and the underfill material affixes the first integrated circuit die to the substrate. |
地址 |
San Jose CA US |