发明名称 |
METHOD AND APPARATUS FOR FORMING SILICON NITRIDE FILM |
摘要 |
The present invention provides a method for forming a silicon nitride film, capable of forming a silicon nitride film with superior physical and electrical features despite an ultra thin film state. The method for forming a silicon nitride film is to form a silicon nitride film on a surface of an object to be processed. The method comprises forming a seed layer functioning as a seed of the silicon nitride film on the surface of the object to be processed by using at least an aminosilane-based gas before forming the silicon nitride film on the surface of the object to be processed (step 2 to step 4). |
申请公布号 |
KR20160002613(A) |
申请公布日期 |
2016.01.08 |
申请号 |
KR20150178053 |
申请日期 |
2015.12.14 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
MURAKAMI HIROKI;WATANABE YOSUKE;HASEBE KAZUHIDE |
分类号 |
H01L21/321;H01L21/02;H01L21/205 |
主分类号 |
H01L21/321 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|