发明名称 METHOD AND APPARATUS FOR FORMING SILICON NITRIDE FILM
摘要 The present invention provides a method for forming a silicon nitride film, capable of forming a silicon nitride film with superior physical and electrical features despite an ultra thin film state. The method for forming a silicon nitride film is to form a silicon nitride film on a surface of an object to be processed. The method comprises forming a seed layer functioning as a seed of the silicon nitride film on the surface of the object to be processed by using at least an aminosilane-based gas before forming the silicon nitride film on the surface of the object to be processed (step 2 to step 4).
申请公布号 KR20160002613(A) 申请公布日期 2016.01.08
申请号 KR20150178053 申请日期 2015.12.14
申请人 TOKYO ELECTRON LIMITED 发明人 MURAKAMI HIROKI;WATANABE YOSUKE;HASEBE KAZUHIDE
分类号 H01L21/321;H01L21/02;H01L21/205 主分类号 H01L21/321
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