发明名称 Silicon Dry Etching Method
摘要 A dry etching method according to the present invention is for etching a silicon layer as a processing target in a processing room, characterized by supplying an iodine heptafluoride-containing etching gas from a gas supply source at a supply pressure of 66 kPa to 0.5 MPa, evacuating the processing room to an internal pressure lower than the supply pressure of the etching gas and, while maintaining the etching gas at the supply pressure, introducing the etching gas into the evacuated processing room so as to etch the silicon layer by the etching gas. It is possible by this dry etching method to etch the silicon upon adiabatic expansion of the etching gas under mild pressure conditions, with no fear of equipment load and equipment cost increase, and achieve good uniformity of in-plane etching amount distribution.
申请公布号 US2016005612(A1) 申请公布日期 2016.01.07
申请号 US201414765413 申请日期 2014.01.24
申请人 CENTRAL GLASS COMPANY, LIMITED 发明人 KIKUCHI Akiou;MORI Isamu;WATARI Masanori
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
主权项 1. A dry etching method for etching a silicon layer as a processing target in a processing room, comprising: supplying an iodine heptafluoride-containing etching gas from a gas supply source at a supply pressure of 66 kPa to 0.5 MPa; evacuating the processing room to an internal pressure lower than the supply pressure of the etching gas; and, while maintaining the etching gas at the supply pressure, introducing the etching gas into the evacuated processing room so as to etch the silicon layer by the etching gas.
地址 Yamaguchi JP