发明名称 |
MEMORY ELEMENT WITH A REACTIVE METAL LAYER |
摘要 |
A memory cell including conductive oxide electrodes is disclosed. The memory cell includes a memory element operative to store data as a plurality of resistive states. The memory element includes a layer of a conductive metal oxide (CMO) (e.g., a perovskite) in contact with an electrode that may comprise one or more layers of material. At least one of those layers of material can be a conductive oxide (e.g., a perovskite such as LaSrCoO3-LSCoO or LaNiO3-LNO) that is in contact with the CMO. The conductive oxide layer can be selected as a seed layer operative to provide a good lattice match with and/or a lower crystallization temperature for the CMO. The conductive oxide layer may also be in contact with a metal layer (e.g., Pt). The memory cell additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays, such as non-volatile two-terminal cross-point memory arrays. |
申请公布号 |
US2016005793(A1) |
申请公布日期 |
2016.01.07 |
申请号 |
US201514850702 |
申请日期 |
2015.09.10 |
申请人 |
Unity Semiconductor Corporation |
发明人 |
Chevallier Christophe J.;Hsia Steve Kuo-Ren;Kinney Wayne;Longcor Steven;Rinerson Darrell;Sanchez John;Swab Philip F.S.;Ward Edmond R. |
分类号 |
H01L27/24;G11C13/00;H01L45/00 |
主分类号 |
H01L27/24 |
代理机构 |
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代理人 |
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主权项 |
1. A re-writeable non-volatile memory device, comprising:
a re-writeable non-volatile two-terminal memory element (ME) comprising tantalum, the ME including
a first terminal,a second terminal,a first layer of a conductive metal oxide (CMO), anda second layer in direct contact with the first layer, the second layer and the first layer operative to store at least one-bit of data as a plurality of resistive states, the first and second layer are electrically in series with each other and with the first and second terminals. |
地址 |
Sunnyvale CA US |