发明名称 SUB-BLOCK DISABLING IN 3D MEMORY
摘要 Some embodiments relate to apparatuses and methods associated with blocks of memory cells. The blocks of memory cells may include two or more sub-blocks of memory cells. One such sub-block may comprise a vertical string of memory cells including a select transistor. An apparatus may include a sub-block disabling circuit. The sub-block disabling circuit may include a content-addressable memory. The content-addressable memory may receive an address, including a block address and a sub-block address. The content addressable memory may output a signal to disable a tagged sub-block if the received address includes the block address and the sub-block address associated with the tagged sub-block. The sub-block disabling circuit may further include a plurality of drivers to drive one or more of the select transistors based on the signal. Other apparatus and methods are described.
申请公布号 EP2962304(A1) 申请公布日期 2016.01.06
申请号 EP20140757046 申请日期 2014.02.27
申请人 MICRON TECHNOLOGY, INC. 发明人 HA, CHANG WAN
分类号 G11C5/02;G11C7/10;G11C11/56;G11C16/08;G11C29/00;G11C29/04 主分类号 G11C5/02
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