发明名称 |
Sample Observation Device |
摘要 |
A sample observation device of the invention includes: a charged particle optical column for irradiating a sample with charged particle beams at a first acceleration voltage, the sample having a target part to be observed which is a concave part; an image acquisition part for acquiring an image including the target part to be observed on the basis of signals obtained by irradiation with the charged particle beams; a memory part for memorizing in advance, at each of a plurality of acceleration voltages, information indicating a relationship between a brightness ratio of a concave part to a periphery part of the concave part in a standard sample and a value indicating a structure of the concave part in the standard sample; and an operation part for obtaining a brightness ratio of the concave part to a periphery part of the concave part in the image. The operation part judges appropriateness/inappropriateness of the first acceleration voltage with the use of the information indicating the relationship and the brightness ratio in the image. |
申请公布号 |
US2015371816(A1) |
申请公布日期 |
2015.12.24 |
申请号 |
US201414763363 |
申请日期 |
2014.01.17 |
申请人 |
Hitachi High- Technologies Corporation |
发明人 |
DOI Ayumi;FUNAKOSHI Tomohiro;YAMAMOTO Takuma;TAMORI Tomohiro;SAKAI Tsunehiro |
分类号 |
H01J37/26;H01J37/28 |
主分类号 |
H01J37/26 |
代理机构 |
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代理人 |
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主权项 |
1. A sample observation device, comprising:
a charged particle optical column for irradiating a sample with charged particle beams at a first acceleration voltage, the sample having a target part to be observed which is a concave part; an image acquisition part for acquiring an image including the target part to be observed on the basis of signals obtained by irradiation with the charged particle beams; a memory part for memorizing in advance, at each of a plurality of acceleration voltages, information indicating a relationship between a brightness ratio of a concave part to a periphery part of the concave part in a standard sample and a value indicating a structure of the concave part in the standard sample; and an operation part for obtaining a brightness ratio of the concave part to a periphery part of the concave part in the image, wherein the operation part judges appropriateness/inappropriateness of the first acceleration voltage with the use of the information indicating the relationship and the brightness ratio in the image. |
地址 |
Minato-ku, Tokyo JP |