发明名称 質量分析計のイオン源を交換するためのシステム及び方法
摘要 <p>A method of replacing an ion source in a mass spectrometer (MS) system is provided, where the ion source includes an ionization volume, at least one ionizing element and at least one focusing element, and where the mass MS system includes the ion source, a vacuum chamber that houses the ion source, and an interlock chamber. The method includes opening a valve between the interlock chamber and the vacuum chamber, moving the ion source into the interlock chamber through the opened valve and closing the valve, and removing the ion source from the interlock chamber. The ion source may further include means for plugging into a docking station in substantially one action, where the docking station provides sufficient electrical connection, upon plugging with the ion source, for operation of the ion source.</p>
申请公布号 JP5838028(B2) 申请公布日期 2015.12.24
申请号 JP20100278763 申请日期 2010.12.15
申请人 アジレント・テクノロジーズ・インクAGILENT TECHNOLOGIES, INC. 发明人 セイファース,キャロリーン,ブロードベント
分类号 H01J49/26;H01J49/10 主分类号 H01J49/26
代理机构 代理人
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