Magnetic Resonance Imaging

摘要

In order to enable efficient calculation of shim settings for a magnetic resonance imaging system, a method for magnetic resonance imaging of an object under investigation using a magnetic resonance device is provided. The method includes acquiring first magnetic resonance image data of the object under investigation using the magnetic resonance device. The method also includes segmenting the first magnetic resonance image data into at least two material classes, calculating a B0 map based on the segmented first magnetic resonance image data and based on susceptibility values of the at least two material classes, and calculating shim settings based on the calculated B0 map. The method also includes acquiring second magnetic resonance image data of the object under investigation using the magnetic resonance device. The acquisition of the second magnetic resonance image data is undertaken using the calculated shim settings.

主权项

1. A method for magnetic resonance imaging of an object under investigation using a magnetic resonance device, the method comprising:
acquiring first magnetic resonance image data of the object under investigation using the magnetic resonance device; segmenting the first magnetic resonance image data into at least two material classes; calculating a B0 map based on the segmented first magnetic resonance image data and based on susceptibility values of the at least two material classes; calculating shim settings based on the calculated B0 map; and acquiring second magnetic resonance image data of the object under investigation using the magnetic resonance device, wherein acquiring the second magnetic resonance image data comprises acquiring the second magnetic resonance image data using the calculated shim settings.