发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes a gate dielectric film on a semiconductor layer. A gate electrode is above the semiconductor layer via the gate dielectric film. A first conductivity-type drain is in the semiconductor layer on one end side of the gate electrode. A second conductivity-type source is in the semiconductor layer on the other end side of the gate electrode and below the gate electrode. A channel is between the gate dielectric film and the source. A drain side end of the source is below a bottom surface of the gate electrode. A region of the drain side end of a surface region of the source is formed using a first material. A region of the surface region of the source other than the drain side end is formed using a second material. An energy band gap of the first material is larger than that of the second material.
申请公布号 US2015364582(A1) 申请公布日期 2015.12.17
申请号 US201414560943 申请日期 2014.12.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 GOTO Masakazu
分类号 H01L29/66;H01L29/10;H01L29/78;H01L29/08;H01L29/165;H01L29/267 主分类号 H01L29/66
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor layer; a gate dielectric film on the semiconductor layer; a gate electrode above the semiconductor layer via the gate dielectric film; a first conductivity type drain layer in the semiconductor layer on one end side of the gate electrode; a second conductivity type source layer in the semiconductor layer on the other end side of the gate electrode and below the gate electrode; and a channel layer between the gate dielectric film and the source layer, wherein a drain side end of the source layer is below a bottom surface of the gate electrode, a region of the drain side end of a surface region of the source layer is formed using a first material, and a region of the surface region of the source layer other than the drain side end is formed using a second material, and an energy band gap of the first material is larger than that of the second material.
地址 Tokyo JP