发明名称 SEMICONDUCTOR LAMINATE STRUCTURE AND SEMICONDUCTOR ELEMENT
摘要 <p>Provided is a semiconductor laminate structure having a Ga 2 O 3 substrate and a nitride semiconductor layer with high crystal quality on the Ga 2 O 3 substrate, and also provided is a semiconductor element containing this semiconductor laminate structure. In one embodiment, this semiconductor laminate structure ( 1 ) is provided with a ²-Ga 2 O 3 substrate ( 2 ) comprising ²- Ga 2 O 3 crystal in which the surface inclined from the (- 201 ) surface in the [ 102 ] direction is the primary surface ( 2 a), and a nitride semiconductor layer ( 4 ) comprising an Al x Ga y In z N ( 0 ‰¤x‰¤ 1 , 0 ‰¤y‰¤ 1 , 0 ‰¤z‰¤ 1 , x+y+z= 1 ) crystal formed by epitaxial crystal growth on the primary surface ( 2 a) of the ²-Ga 2 O 3 substrate ( 2 ).</p>
申请公布号 EP2858094(A4) 申请公布日期 2015.12.16
申请号 EP20130798034 申请日期 2013.05.27
申请人 TAMURA CORPORATION;KOHA CO., LTD. 发明人 IIZUKA, KAZUYUKI;WATANABE, SHINYA;KOSHI, KIMIYOSHI;WAKIMOTO, DAIKI;YAMASHITA, YOSHIHIRO;SATO, SHINKURO
分类号 H01L21/205;C23C16/34;C30B25/18;C30B29/16;C30B29/38;C30B29/40;H01L29/20;H01L33/16;H01L33/32 主分类号 H01L21/205
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