| 摘要 |
A plate inspection system and a plate inspection method with which irregularities in phase difference caused in a retardation layer can be efficiently detected. The inspection system is for inspecting a plate to be inspected having a retardation layer 3. The plate inspection system comprises a polarized-light source for irradiating a polarized light 50 and an observation-side polarizer 20 placed on the observation side. In the inspection system, a plate to be inspected is placed between the polarized-light source 50 and the observation-side polarizer 20 so that the plate to be inspected is irradiated with polarized light from the polarized-light source 50. The position of at least the observation-side polarizer 20 or the plate to be inspected is changeable relative to the polarized-light source 50.
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