| 摘要 |
A circuit assemblage for functional checking of a power transistor includes a power transistor having an insulated gate, a first power electrode configured as a drain or as a collector, and a second power electrode configured as a source or an emitter, the first and second power electrode being connected to a power circuit having a DC voltage source and an electrical DC load. The circuit assemblage further includes a control application device having a signal output that is connected to the gate; a capacitance measuring device for measuring the gate terminal capacitance between the gate terminal contact and the second power electrode terminal contact; and an evaluation device for comparing the gate terminal capacitance with the gate capacitance, and outputting a fault signal as a function of the comparison.
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