| 发明名称 |
Methods and systems for semiconductor diode junction screening and lifetime estimation |
| 摘要 |
Screening methods and systems that can detect semiconductor junction devices that may exhibit sudden failure.
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| 申请公布号 |
US7592825(B1) |
申请公布日期 |
2009.09.22 |
| 申请号 |
US20060508054 |
申请日期 |
2006.08.22 |
| 申请人 |
SCIENCE RESEARCH LABORATORY, INC. |
发明人 |
JACOB JONAH H. |
| 分类号 |
G01R31/00 |
主分类号 |
G01R31/00 |
| 代理机构 |
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