发明名称 RADIATION-SENSITIVE COMPOSITION AND RESIST PATTERN FORMING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a radiation-sensitive composition capable of forming a resist film having a refractive index of &ge;1.72 at a wavelength of 193 nm and capable of patterning. <P>SOLUTION: The radiation-sensitive composition includes a polymer (A) including a repeating unit represented by general formula (1) (wherein R<SP>1</SP>denotes a hydrogen atom or a methyl group; R<SP>2</SP>-R<SP>4</SP>each denote a hydrogen atom, a 1-6C linear alkyl group or the like; R<SP>5</SP>-R<SP>10</SP>each denote a hydrogen atom, a 1-6C linear alkyl group or the like; and n is 0, 1 or 2) and a radiation-sensitive acid generator (B). <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009198867(A) 申请公布日期 2009.09.03
申请号 JP20080041163 申请日期 2008.02.22
申请人 JSR CORP 发明人 KAWAKAMI MINEKI;SUGIURA MAKOTO;KUSUMOTO SHIRO
分类号 G03F7/039;C08F20/38;H01L21/027 主分类号 G03F7/039
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