发明名称 Methods and structures for planar and multiple-gate transistors formed on SOI
摘要 A semiconductor device includes an insulator layer, a semiconductor layer, a first transistor, and a second transistor. The semiconductor layer is overlying the insulator layer. A first portion of the semiconductor layer has a first thickness. A second portion of the semiconductor layer has a second thickness. The second thickness is larger than the first thickness. The first transistor has a first active region formed from the first portion of the semiconductor layer. The second transistor has a second active region formed from the second portion of the semiconductor layer. The first transistor may be a planar transistor and the second transistor may be a multiple-gate transistor, for example.
申请公布号 US7851276(B2) 申请公布日期 2010.12.14
申请号 US20070676480 申请日期 2007.02.19
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YANG FU-LIANG;YEO YEE-CHIA;HU CHENMING
分类号 H01L21/00;H01L21/336;H01L21/48;H01L21/84;H01L27/01;H01L27/12;H01L29/78;H01L29/786 主分类号 H01L21/00
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