发明名称 PLATING APPARATUS FOR METALLIZATION ON SEMICONDUCTOR WORKPIECE
摘要 The present invention provides a plating apparatus with multiple anode zones and cathode zones. The electrolyte flow field within each zone is controlled individually with independent flow control devices. A gas bubble collector whose surface is made into pleated channels is implemented for gas removal by collecting small bubbles, coalescing them, and releasing the residual gas. A buffer zone built within the gas bubble collector further allows unstable microscopic bubbles to dissolve.
申请公布号 US2010307913(A1) 申请公布日期 2010.12.09
申请号 US20100734438 申请日期 2010.08.09
申请人 ACM RESEARCH (SHANGHAI) INC. 发明人 MA YUE;WANG XI;HUANG YUNWEN;PANG ZHENXU;NUCH VOHA;WANG DAVID
分类号 C25D17/00;C25D17/02;C25D17/10 主分类号 C25D17/00
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