发明名称 PROBE AND PROBE ASSEMBLY
摘要 PROBLEM TO BE SOLVED: To provide a probe assembly capable of exchanging a probe and suitable for narrow pitch array.SOLUTION: The probe assembly includes: a plurality of probes each of which includes a support, a belt-like fixing part, and a needle tip which is extending from the end of the fixing part with narrower width dimension than the width dimension of the fixing part, which are a plurality of probes wherein the fixing part is arranged oppositely in parallel on the downside of the support while a width direction of the fixing part is a vertical direction; and an elongate support bar extending through the fixing part of the probes in the thickness direction in order to support each probe detachably, and supported by the support. One surface of the probe is covered with an insulating film for covering the surface partially, and the whole surface of the other surface is an exposed surface.
申请公布号 JP2011203275(A) 申请公布日期 2011.10.13
申请号 JP20110148815 申请日期 2011.07.05
申请人 MICRONICS JAPAN CO LTD 发明人 KUGA TOMOAKI;YASUDA TAKAO;DEWA HARUMASA;ROKUNOHE JURI
分类号 G01R1/073;H01L21/66 主分类号 G01R1/073
代理机构 代理人
主权项
地址
您可能感兴趣的专利