发明名称 SUBSTRATE INSPECTION DEVICE AND CORRECTION INFORMATION ACQUISITION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To acquire correction information capable of cancelling positional deviations caused by movement of a unit holding part by a movement mechanism, even in a state in which a probe unit is not held by the unit holding part. <P>SOLUTION: A correction information acquisition method comprises the steps of: controlling the movement mechanism in accordance with movement control information Dp to move a test head holding part 6 provided with a position specifying mark 6m to a position where "second imaging processing" is executed (step 56(56a)); controlling a camera 5 to execute the "second imaging processing" in which the test head holding part 6 is imaged and imaging data D2 is outputted (step 57); and acquiring an amount of positional deviations between a position of a mark 6m specified based on the imaging data D2 and a position of a mark 6m specified based on "holding part mark position information", and a direction of the positional deviations therebetween, as correction information Dr for correcting the movement control information Dp used in "probing processing", to allow a storage section to store them (steps 58 and 59). <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013068510(A) 申请公布日期 2013.04.18
申请号 JP20110207165 申请日期 2011.09.22
申请人 HIOKI EE CORP 发明人 ANDO KOICHI
分类号 G01R31/02;H05K3/00 主分类号 G01R31/02
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