发明名称 ILLUMINATION SYSTEM FOR ILLUMINATING MASK IN MICROLITHOGRAPHIC EXPOSURE APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an illumination system that includes an array of reflecting elements, which may be realized as a microelectromechanical system (MEMS), particularly as a digital micromirror device (DMD).SOLUTION: An illumination system for illuminating a mask 16 in a microlithographic exposure apparatus has an optical axis 60 and a pupil surface 70. The system comprises a beam deflection array 46 of reflective or transparent beam deflection elements (M) such as mirrors, and each deflection element (M) is adapted to deflect an impinging light ray by a deflection angle that is variable in response to a control signal. The system further comprises an optical raster element 34 including a plurality of microlenses and/or diffractive structures. The beam deflection elements (M), which are arranged in a first plane 40, and the optical raster element 34, which is arranged in a second plane 36, commonly produce a two-dimensional far field intensity distribution. An optical imaging system 38, 41 optically conjugates the first plane 40 to the second plane 34.
申请公布号 JP2013254978(A) 申请公布日期 2013.12.19
申请号 JP20130168154 申请日期 2013.08.13
申请人 CARL ZEISS SMT GMBH 发明人 MARKUS DEGUNTHER;PAUL GRAEUPNER;JUERGEN FISCHER
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
代理机构 代理人
主权项
地址