| 摘要 |
<p>Methods and systems are presented for analysing samples of a semiconductor material, such as silicon wafers useful for manufacturing photovoltaic cells, for the purpose of assigning grades to the samples, and optionally sorting them into quality bins. The samples are subjected to a photoluminescence-based analysis and at least one non-photoluminescence-based analysis, and the data processed to obtain information on one or more sample properties. The samples are then graded, and optionally sorted, based on these one or more properties. In preferred embodiments the grades are indicative of the performance of photovoltaic cells to be manufactured from the samples.</p> |
