发明名称 Device for determining the concentration of at least one gas in a sample gas stream
摘要 A device for determining a concentration of at least one gas in a sample gas stream includes an analysis chamber, a detector, and a connecting channel. The analysis chamber is configured to have the sample gas stream and a reaction gas stream be introduced therein. The sample gas stream and the reaction gas stream are mixed to a gas mixture which reacts so as to emit an optical radiation. The detector is configured to measure the optical radiation. The connecting channel is configured to connect the analysis chamber to the detector. The connecting channel is configured as a light conductor extending from the analysis chamber to the detector.
申请公布号 US9212999(B2) 申请公布日期 2015.12.15
申请号 US201314396388 申请日期 2013.03.12
申请人 AVL EMISSION TEST SYSTEMS GMBH 发明人 Kreft Norbert
分类号 G01N21/76;G01N33/00 主分类号 G01N21/76
代理机构 代理人 Thot Norman B.
主权项 1. A device for determining a concentration of at least one gas in a sample gas stream, the device comprising: an analysis chamber configured to have the sample gas stream and a reaction gas stream be introduced therein, the sample gas stream and the reaction gas stream being mixed to a gas mixture which reacts so as to emit an optical radiation; an analysis chamber housing comprising a receiving opening, the analysis chamber housing being configured to have the analysis chamber be arranged therein; a first sealing ring; a detector configured to measure the optical radiation; a connecting channel configured to directly connect the analysis chamber to the detector; and a sleeve surrounding the connecting channel; wherein, the connecting channel is configured as a solid light conductor having a distal and a proximal end extending from the analysis chamber to the detector; wherein, the sleeve is arranged so as to protrude into the receiving opening of the analysis chamber housing, and the first sealing ring is arranged so as to be interpositioned between the analysis chamber housing and the sleeve sealing the analysis chamber to the proximal end of the solid light conductor.
地址 Neuss DE